Description

This thesis falls within the field of cooled infrared detectors. The CEA-LETI-MINATEC Infrared Laboratory specializes in the design and manufacture of infrared camera prototypes used in defense, astronomy, environmental monitoring, and satellite meteorology. In this context of high-performance imaging, it is crucial to ensure optimal detector quality. However, manufacturing processes can introduce defects that can degrade sensor performance. Understanding and controlling these defects is essential to increase reliability and optimize processes. The objective of the thesis is to identify and precisely characterize these defects using cutting-edge techniques, rarely combined, such as Laue microdiffraction and FIB-SEM nanotomography, enabling structural analysis at different scales. By linking the nature and origin of defects to manufacturing processes and quantifying their impact on performance, the doctoral student will contribute directly to improving the reliability and efficiency of next-generation infrared sensors. The doctoral student will join a team covering the entire detector manufacturing chain and will actively participate in the development (LETI clean room) and structural characterization (CEA-Grenoble platform, advanced techniques) of samples. He/she will also be involved in electro-optical characterization in partnership with the Cooled Infrared Imaging Laboratory (LIR), which specializes in detailed analysis of active materials at cryogenic temperatures.